What is MORDRED?

MORDRED is a European 7^th framework collaborative project entitled “Modelling of the reliability and degradation of next generation nanoelectronic devices”. The project focuses on developing multiscale modelling technology, supported by comprehensive experimental characterization techniques, to study the degradation and reliability of next generation Complimentary-Metal-Oxide-Semiconductor (CMOS) devices. The project will provide technologists, device engineers and designers in the nano CMOS industry with tools, reference databases and examples of how to produce future devices that are economical, efficient, and meet high performance, reliability and degradation standards.

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